A Closed-Loop Approach to Reducing Scan Errors in Nanopositioning Platforms
World Congress, Volume # 17 | Part# 1
Authors
Aphale, Sumeet; Bhikkaji, Bharath; Moheimani, S.O. Reza
Identifier
10.3182/20080706-5-KR-1001.01998
Index Terms
Perception devices and positioning systems; Identification and control methods; Mechatronic systems
Abstract
Piezoelectric stack-actuated parallel-kinematic nanopositioning platforms have their first resonant mode at relatively low frequencies and also suffer from nonlinearities such as hysteresis and creep, resulting in a typically low-grade positioning performance. Closed- loop control algorithms have shown the potential to eliminate these problems and achieve robust, repeatable nanopositioning. In this work, the performance of three commonly used damping controllers is compared based on their closed-loop noise characteristics. The best one is combined with an integrator to produce accurate raster scans of large areas while imparting substantial damping to the system and minimizing inherent nonlinearities. A scanning resolution of approximately 8nm, over a 100μm × 100μm area is achieved.
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